| Shelfclass_id | 6.A |
| Sortkey | MDR |
| Authors | RAC, Reliability Analysis Center (U.S.) |
| Title | MDR 17: Microcircuit Device Reliability: Digital Failure Rate Data: MDR-17: Summer 1981 |
| Publisher | IIT Research Institute |
| Year | 1981 |
| Languages | eng |
| Series | Microcircuit Device Reliability |
| Volume | MDR-17 |
| Description | xiv, 404 p. 28 cm |
| Record date | 20110614 |
| Location | Griffiss Air Force Base, N.Y. |
| Keywords | Hybrid integrated circuits, Reliability |