Shelfclass_id | 6.A |
Sortkey | MDR |
Authors | Prepared by: Henry C. Rickers |
Title | MDR 07: Microcircuit Device Reliability: Memory/LSI Data: MDR-7: Winter 77-78 |
Publisher | IIT Research Institute |
Year | 1977 |
Languages | eng |
Series | Microcircuit Device Reliability |
Volume | MDR-7 |
Description | vi, 272 p. 28 cm |
Record date | 20110614 |
Location | Griffiss Air Force Base, N.Y. |
Keywords | Hybrid integrated circuits, Reliability |