Shelfclass_id | 6.A |
Sortkey | MDR |
Authors | Prepared by: David B. Nicholls |
Title | MDR 10: Microcircuit Device Reliability: Digital Evaluation and Generic Failure Analysis Data: MDR-10: January 1979 |
Publisher | IIT Research Institute |
Year | 1978 |
Languages | eng |
Series | Microcircuit Device Reliability |
Volume | MDR-10 |
Description | ix, 344 p. 28 cm |
Record date | 20110614 |
Location | Griffiss Air Force Base, N.Y. |
Keywords | Hybrid integrated circuits, Reliability |