| Shelfclass_id | 6.A |
| Sortkey | EOS |
| Authors | EOS/ESD Association ; IEEE |
| Title | EOS 1990: Electrical Overstress/Electrostatic Discharge Symposium Proceedings 1990: EOS-12: Lake Buena Vista, Florida, September 11-13, 1990 |
| Publisher | EOS/ESD Association |
| Year | 1990 |
| Languages | eng |
| Isbn | 1878303236 |
| Series | EOS/ESD Association |
| Volume | 12 |
| Description | xi, 230 p. 28 cm |
| Record date | 20110625 |
| Location | New York |
| Keywords | Hybrid integrated circuits, Reliability |