| Shelfclass_id | 6.A |
| Sortkey | EOS |
| Authors | RAC, Reliability Analysis Center (U.S.) |
| Title | EOS 1979: Electrical Overstress/Electrostatic Discharge Symposium Proceedings: EOS-1: Denver, Colorado, September 24-27, 1979 |
| Publisher | IIT Research Institute |
| Year | 1980 |
| Languages | eng |
| Series | EOS/ESD Association |
| Volume | 1 |
| Description | v, 224 p. 28 cm |
| Record date | 20110614 |
| Location | Griffiss Air Force Base, N.Y. |
| Keywords | Hybrid integrated circuits, Reliability |