| Shelfclass_id | 6.A |
| Sortkey | EOS |
| Authors | EOS/ESD Association ; IIT Research Institute |
| Title | EOS 1989: Electrical Overstress/Electrostatic Discharge Symposium Proceedings 1989: EOS-11: New Orleans, Louisiana, September 26-28, 1989 |
| Publisher | EOS/ESD Association |
| Year | 1989 |
| Languages | eng |
| Isbn | 1878303163 |
| Series | EOS/ESD Association |
| Volume | 11 |
| Description | xi, 230 p. 28 cm |
| Record date | 20110625 |
| Location | New York |
| Keywords | Hybrid integrated circuits, Reliability |