Shelfclass_id |
6.A |
Sortkey |
AUTOMATIC |
Authors |
IERE, IQA, IEE, NETWORK (Organization) |
Title |
Automatic 1980 V1: Automatic Testing 80 Conference Proceedings: Session 1: Production Testing and Testing of PCBs and Components: Palais des Congrès, Paris, France, 23, 24, 25 September, 1980 |
Publisher |
NETWORK |
Year |
1980 |
Languages |
eng |
Isbn |
0904999785 |
Description |
213 p. 30 cm |
Record date |
20110625 |
Location |
Buckingham, England |
Keywords |
Automatic test equipment, Electronic measurements |
Notes |
"This is one of three volumes." |