| Shelfclass_id | 4.N |
| Sortkey | SINGH, NARINDER |
| Authors | Narinder Singh |
| Title | An Artificial Intelligence Approach to Test Generation |
| Publisher | Kluwer Academic Publishers |
| Year | c1987 |
| Languages | eng |
| Isbn | 0898381851 |
| Series | The Kluwer international series in engineering and computer science |
| Volume | 19 |
| Description | x, 193 p. ill. 25 cm. |
| Record date | 20081027 |
| Location | Boston |
| Keywords | Integrated circuits, Expert systems (Computer science), Artificial intelligence |