| Shelfclass_id | 4.L |
| Sortkey | BATCHELOR, BRUCE G |
| Authors | Bruce G. Batchelor, Frederick M. Waltz |
| Title | Machine Vision Systems Integration: Proceedings of a Conference held 6-7 November 1990, Boston, Massachusetts |
| Publisher | SPIE Optical Engineering Press |
| Year | c1991 |
| Languages | eng |
| Isbn | 0819404705, 0819404713 |
| Series | Critical reviews of optical science and technology |
| Volume | 36 |
| Description | (hardcover) (softcover) ix, 176 p. ill. 27 cm |
| Record date | 20060727 |
| Location | Bellingham, Wash., USA |
| Keywords | Quality control, Computer vision, Engineering inspection |