| Shelfclass_id | 4.G |
| Sortkey | LAIRD, PHILIP D |
| Authors | Philip D. Laird |
| Title | Learning from Good and Bad Data |
| Publisher | Kluwer Academic Publishers |
| Year | c1988 |
| Languages | eng |
| Isbn | 0898382637 |
| Series | The Kluwer international series in engineering and computer science |
| Volume | 47 |
| Description | xviii, 211 p. ill. 25 cm |
| Record date | 20060724 |
| Location | Boston |
| Keywords | Machine learning, Artificial intelligence, Computers, System identification |
| Notes | Includes index |